Thrust Project No. P-2E: Computational Intelligence & Physical Analytics (CIPA) for Nanomanufacturing Performance Enhancement |
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Related Test Tesbed(s): High-Speed Inkjet Testbed; R2R Nanoshape Imprinting and Slot Die Coating Testbed; WS Metal Assisted Chemical Etching Testbed |
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P-2E.1-T-A |
CIPA-based Real-Time Algorithms for Picoliter Volume, Reliable Inkjetting |
Brent Snyder |
S.V. Sreenivasan |
P-2E.3-T |
Understanding Defect Formation Mechanisms in Gravure Printing of Nanomaterials using Machine Learning |
Robert Malakhov |
P Randall Schunk |
Thrust Project No. P-2F: Process Anomaly Detection and Mitigation for Yield Enhancement |
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Related Test Tesbed(s): WS Nanoshape Imprinting Testbed; R2R PVD Testbed |
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P-2F.2-S |
Anomaly Detection and Mitigation for R2R PVD Process Control |
Noah Graf |
Dragan Djurdjanovic |
P-2F.3-S |
Virtual Critical Dimension Metrology for Large Area Nanopatterened Structures. |
Ramin Sabbagh |
Dragan Djurdjanovic |
NASCENT Friday Seminar - Dec. 6, 2019
Event Status
Scheduled