Please join us for the GRA project presentations by the speakers noted below.
Thrust Project No. P-2B: R2R In Situ Electrical and Thermal Characterization of 2D Materials |
|||
Related Testbed(s): High-speed R2R Spectrophotometry; Optical Non-Contact Metrology for Thermal and Electronic Properties of 2D Materials |
|||
Sub-project numbers |
Sub-project title |
Primary Student(s) or Postdoc(s) |
Supervising professor(s) |
P-2B.1-T |
Large Area Photonic Device Functional Nanometrology |
Brian Gawlik |
S.V. Sreenivasan |
P-2B.2-K |
Metrology of Nanostructured Patterns using Liquid Drop Dynamics |
Xuemei Wang |
Steve Brueck |
P-2B.3-T |
Optical Metrology of Thermal, Electrical and Optical Properties of 2D Materials |
Yongjian Zhou |
Yaguo Wang |
P-2B.4-K |
Opto-thermal and Electro-Thermal Metrologies of Transferred 2D Materials |
Brandon Smith |
Li Shi |
|
|
|
|
Thrust Project No. P-2C: R2R Tip Based Metrology for Nano-Shaped Optical Metamaterials |
|||
Related Testbed(s): WS Nanosculpting |
|||
Sub-project numbers |
Sub-project title |
Primary Student(s) or Postdoc(s) |
Supervising professor(s) |
P-2C.2-K |
Tip Based Thermal Metrology for Flex Devices and Thermal Management Materials |
David Choi |
Li Shi |
P-2C.4-T |
Fabrication of Single GaN NanoWire AFM Probes and LEDs |
Mahmoud Behzadirad |
Tito Busani |
P-2C.5-K |
Mechanical and Optical Properties of Nanowires for Tip-Based Metrology Applications |
Neal Wostbrock |
Tito Busani |
P-2C.6-T-A |
In-line, Roll-to-Roll, Scanning Probe Metrology for Flexible Electronics and Nanopatterned Materials |
Liam G. Connolly |
Michael Cullinan |